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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analyzing device
Patent number
9,978,044
Issue date
May 22, 2018
Hitachi High-Technologies Corporation
Miki Taki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic analysis device
Patent number
9,383,375
Issue date
Jul 5, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,341,638
Issue date
May 17, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
9,291,634
Issue date
Mar 22, 2016
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
8,658,102
Issue date
Feb 25, 2014
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Particle image analysis method and apparatus
Patent number
8,538,119
Issue date
Sep 17, 2013
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Grant
Input and output buffer module for clinical analyzer
Patent number
D685495
Issue date
Jul 2, 2013
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Cover for reagent disk for clinical analyzer
Patent number
D685494
Issue date
Jul 2, 2013
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Clinical analyzer
Patent number
D681226
Issue date
Apr 30, 2013
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Clinical analyzer
Patent number
D681227
Issue date
Apr 30, 2013
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Input and output buffer module for clinical analyzer
Patent number
D681228
Issue date
Apr 30, 2013
Hitachi High-Technologies Corporation
Mitsuru Oonuma
D24 - Medical and laboratory equipment
Information
Patent Grant
Analysis device
Patent number
8,151,190
Issue date
Apr 3, 2012
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,722,815
Issue date
May 25, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D614191
Issue date
Apr 20, 2010
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D614192
Issue date
Apr 20, 2010
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,670,558
Issue date
Mar 2, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Graphical user interface for a computer display
Patent number
D602496
Issue date
Oct 20, 2009
Hitachi High-Technologies Corporation
Masaki Takano
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Monitoring method of stain solution for particle analysis and calib...
Patent number
5,728,582
Issue date
Mar 17, 1998
Hitachi, Ltd.
Miki Taki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE
Publication number
20140322080
Publication date
Oct 30, 2014
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20140147335
Publication date
May 29, 2014
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20140147348
Publication date
May 29, 2014
Hitachi High-Technologies Corporation
Hajime KATOU
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING DEVICE
Publication number
20130311243
Publication date
Nov 21, 2013
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS APPARATUS
Publication number
20120134559
Publication date
May 31, 2012
Hitachi High-Technologies Corporation
Akiko Suzuki
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS METHOD AND APPARATUS
Publication number
20110090247
Publication date
Apr 21, 2011
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20100233027
Publication date
Sep 16, 2010
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Analysis device
Publication number
20070038411
Publication date
Feb 15, 2007
Miki Taki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20070009387
Publication date
Jan 11, 2007
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20030166260
Publication date
Sep 4, 2003
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL