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MIKIHIKO KOBAYASHI

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  • IBARAKI, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Bimetallic probe with tip end
    • Patent number 7,692,438
    • Issue date Apr 6, 2010
    • National Institute for Materials Science
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Process for precise arrangement of micro-bodies
    • Patent number 7,323,227
    • Issue date Jan 29, 2008
    • Japan as represented by Director General of National Research Institute of Me...
    • Hiroshi Fudoji
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Method of forming patterned thin film
    • Patent number 6,548,412
    • Issue date Apr 15, 2003
    • National Institute for Materials Science
    • Hiroshi Fudoji
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents