Mikihiro Kajita

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Power supply noise measuring circuit and power supply noise measuri...
- Patent number 8,531,190
- Issue date Sep 10, 2013
- NEC Corporation
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring device and method
- Patent number 8,444,316
- Issue date May 21, 2013
- NEC Corporation
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Power supply noise reduction circuit and power supply noise reducti...
- Patent number 8,278,998
- Issue date Oct 2, 2012
- NEC Corporation
- Mikihiro Kajita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus, circuit and method of monitoring leakage current charact...
- Patent number 8,018,240
- Issue date Sep 13, 2011
- NEC Corporation
- Mikihiro Kajita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus, circuit and method of monitoring performance
- Patent number 7,768,303
- Issue date Aug 3, 2010
- NEC Corporation
- Mikihiro Kajita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply noise measuring circuit and power supply noise measuri...
- Patent number 7,688,098
- Issue date Mar 30, 2010
- NEC Corporation
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Grant
Signal measuring circuit and signal measuring method
- Patent number 7,526,390
- Issue date Apr 28, 2009
- NEC Corporation
- Mikihiro Kajita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply noise measuring device
- Patent number 7,116,114
- Issue date Oct 3, 2006
- NEC Corporation
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Grant
Vertical-cavity surface-emitting laser device
- Patent number 6,687,280
- Issue date Feb 3, 2004
- NEC Corporation
- Mikihiro Kajita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel transmission method and system
- Patent number 6,509,985
- Issue date Jan 21, 2003
- NEC Corporation
- Mikihiro Kajita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Process for transferring a device to a substrate by viewing a regis...
- Patent number 5,459,081
- Issue date Oct 17, 1995
- NEC Corporation
- Mikihiro Kajita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURI...
- Publication number 20110025346
- Publication date Feb 3, 2011
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING DEVICE AND METHOD
- Publication number 20100272149
- Publication date Oct 28, 2010
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT CIRCUIT
- Publication number 20100142587
- Publication date Jun 10, 2010
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, circuit and method of monitoring circuit characteristic
- Publication number 20090201011
- Publication date Aug 13, 2009
- NEC Corporation
- Mikihiro Kajita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus, circuit and method of monitoring performance
- Publication number 20090167360
- Publication date Jul 2, 2009
- NEC Corporation
- Mikihiro Kajita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURI...
- Publication number 20080218195
- Publication date Sep 11, 2008
- NEC Corporation
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Application
Signal measuring circuit and signal measuring method
- Publication number 20070094581
- Publication date Apr 26, 2007
- NEC Corporation
- Mikihiro Kajita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Power supply noise reduction circuit and power supply noise reducti...
- Publication number 20060092675
- Publication date May 4, 2006
- NEC Corporation
- Mikihiro Kajita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Power supply noise measuring device
- Publication number 20050212528
- Publication date Sep 29, 2005
- Mikihiro Kajita
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting abnormality of optical module and apparatus fo...
- Publication number 20020024691
- Publication date Feb 28, 2002
- NEC Corporation
- Mikihiro Kajita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Mikihiro Kajita

Person

Patents Grantslast 30 patents

Power supply noise measuring circuit and power supply noise measuri...

Temperature measuring device and method

Power supply noise reduction circuit and power supply noise reducti...

Apparatus, circuit and method of monitoring leakage current charact...

Apparatus, circuit and method of monitoring performance

Power supply noise measuring circuit and power supply noise measuri...

Signal measuring circuit and signal measuring method

Power supply noise measuring device

Vertical-cavity surface-emitting laser device

Parallel transmission method and system

Process for transferring a device to a substrate by viewing a regis...

Patents Applicationslast 30 patents

POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURI...

TEMPERATURE MEASURING DEVICE AND METHOD

TEMPERATURE MEASUREMENT CIRCUIT

Apparatus, circuit and method of monitoring circuit characteristic

Apparatus, circuit and method of monitoring performance

POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURI...

Signal measuring circuit and signal measuring method

Power supply noise reduction circuit and power supply noise reducti...

Power supply noise measuring device

Method for detecting abnormality of optical module and apparatus fo...