Mikio ASAI

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of diagnosing semiconductor device
- Patent number 10,324,123
- Issue date Jun 18, 2019
- Renesas Electronics Corporation
- Hisao Kobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of diagnosing semiconductor device
- Patent number 9,829,532
- Issue date Nov 28, 2017
- Renesas Electronics Corporation
- Hisao Kobashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method and device for semiconductor circuit
- Patent number 6,150,831
- Issue date Nov 21, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Mikio Asai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with identification function
- Patent number 5,894,172
- Issue date Apr 13, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masahiko Hyozo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated device having independent circuit blocks a...
- Patent number 5,844,263
- Issue date Dec 1, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Mikio Asai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE
- Publication number 20180080976
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Hisao KOBASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE
- Publication number 20170168109
- Publication date Jun 15, 2017
- RENESAS ELECTRONICS CORPORATION
- Hisao KOBASHI
- G01 - MEASURING TESTING