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Mikio Kasama
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Mito, JP
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last 30 patents
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Patent Grant
Automatic analyzer
Patent number
8,600,689
Issue date
Dec 3, 2013
Hitachi High-Technologies Corporation
Toshihide Orihashi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Automatc analyzer
Publication number
20070072299
Publication date
Mar 29, 2007
Toshihide Orihashi
G01 - MEASURING TESTING