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Mikio Nagahara
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Matsumoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Satellite signal receiver
Patent number
9,733,362
Issue date
Aug 15, 2017
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit for satellite signal reception
Patent number
9,716,545
Issue date
Jul 25, 2017
Seiko Epson Corporation
Naoki Gobara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of determining adequacy and adequacy determining device
Patent number
9,354,320
Issue date
May 31, 2016
Seiko Epson Corporation
Hideo Sasahara
G01 - MEASURING TESTING
Information
Patent Grant
Cross correlation determination method and cross correlation determ...
Patent number
8,953,721
Issue date
Feb 10, 2015
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Bit change determination method and bit change determination device
Patent number
8,761,232
Issue date
Jun 24, 2014
Seiko Epson Corporation
Naoki Gobara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Position determination method, positioning device, and electronic i...
Patent number
8,482,458
Issue date
Jul 9, 2013
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Present position locating method
Patent number
8,164,513
Issue date
Apr 24, 2012
Seiko Epson Corporation
Shinichi Mitsunaga
G01 - MEASURING TESTING
Information
Patent Grant
First output position calculation method, storage medium, positioni...
Patent number
8,072,372
Issue date
Dec 6, 2011
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Terminal device, positioning method, and recording medium
Patent number
8,022,865
Issue date
Sep 20, 2011
Seiko Epson Corporation
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Grant
Present position locating method, positioning device, and electroni...
Patent number
7,961,142
Issue date
Jun 14, 2011
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Positioning method, positioning device, and electronic instrument
Patent number
7,928,902
Issue date
Apr 19, 2011
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Position determination method, positioning device, and electronic i...
Patent number
7,800,532
Issue date
Sep 21, 2010
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Terminal device, positioning method, and recording medium
Patent number
7,679,558
Issue date
Mar 16, 2010
Seiko Epson Corporation
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Grant
Present position locating method
Patent number
7,623,069
Issue date
Nov 24, 2009
Seiko Epson Corporation
Shinichi Mitsunaga
G01 - MEASURING TESTING
Information
Patent Grant
First output position calculation method, storage medium, positioni...
Patent number
7,612,713
Issue date
Nov 3, 2009
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Information
Patent Grant
Satellite information update system, positioning auxiliary informat...
Patent number
7,242,348
Issue date
Jul 10, 2007
Seiko Epson Corporation
Mikio Nagahara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPORT ACTIVITY RECORDING APPARATUS AND SPORT ACTIVITY RECORDING METHOD
Publication number
20160361598
Publication date
Dec 15, 2016
SEIKO EPSON CORPORATION
Mikio Nagahara
G04 - HOROLOGY
Information
Patent Application
INTEGRATED CIRCUIT FOR SATELLITE SIGNAL RECEPTION
Publication number
20150162976
Publication date
Jun 11, 2015
SEIKO EPSON CORPORATION
Naoki GOBARA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SATELLITE SIGNAL RECEIVER
Publication number
20150123848
Publication date
May 7, 2015
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETERMINING ADEQUACY AND ADEQUACY DETERMINING DEVICE
Publication number
20120154205
Publication date
Jun 21, 2012
SEIKO EPSON CORPORATION
Hideo SASAHARA
G01 - MEASURING TESTING
Information
Patent Application
CROSS CORRELATION DETERMINATION METHOD AND CROSS CORRELATION DETERM...
Publication number
20120134392
Publication date
May 31, 2012
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
BIT CHANGE DETERMINATION METHOD AND BIT CHANGE DETERMINATION DEVICE
Publication number
20120057662
Publication date
Mar 8, 2012
SEIKO EPSON CORPORATION
Naoki Gobara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
POSITION DETERMINATION METHOD, POSITIONING DEVICE, AND ELECTRONIC I...
Publication number
20100302097
Publication date
Dec 2, 2010
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL DEVICE, POSITIONING METHOD, AND RECORDING MEDIUM
Publication number
20100141524
Publication date
Jun 10, 2010
SEIKO EPSON CORPORATION
Shigeru IMAFUKU
G01 - MEASURING TESTING
Information
Patent Application
PRESENT POSITION LOCATING METHOD
Publication number
20100079335
Publication date
Apr 1, 2010
SEIKO EPSON CORPORATION
Shinichi MITSUNAGA
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING METHOD, POSITIONING DEVICE, AND ELECTRONIC INSTRUMENT
Publication number
20100045516
Publication date
Feb 25, 2010
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
FIRST OUTPUT POSITION CALCULATION METHOD, STORAGE MEDIUM, POSITIONI...
Publication number
20100007557
Publication date
Jan 14, 2010
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETERMINATION METHOD, POSITIONING DEVICE, AND ELECTRONIC I...
Publication number
20090096672
Publication date
Apr 16, 2009
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
PRESENT POSITION LOCATING METHOD
Publication number
20090040104
Publication date
Feb 12, 2009
SEIKO EPSON CORPORATION
Shinichi MITSUNAGA
G01 - MEASURING TESTING
Information
Patent Application
PRESENT POSITION LOCATING METHOD, POSITIONING DEVICE, AND ELECTRONI...
Publication number
20080246660
Publication date
Oct 9, 2008
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
FIRST OUTPUT POSITION CALCULATION METHOD, STORAGE MEDIUM, POSITIONI...
Publication number
20080246661
Publication date
Oct 9, 2008
SEIKO EPSON CORPORATION
Mikio NAGAHARA
G01 - MEASURING TESTING
Information
Patent Application
Timepiece
Publication number
20080030402
Publication date
Feb 7, 2008
SEIKO EPSON CORPORATION
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Application
Satellite information update system, positioning auxiliary informat...
Publication number
20060012517
Publication date
Jan 19, 2006
SEIKO EPSON CORPORATION
Mikio Nagahara
G01 - MEASURING TESTING