Mikio Naruse

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
TEM sample equipped with an identifying function, focused ion beam...
- Patent number 7,095,024
- Issue date Aug 22, 2006
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for preparing specimen
- Patent number 5,907,157
- Issue date May 25, 1999
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Specimen-holding device for electron microscope
- Patent number 5,406,087
- Issue date Apr 11, 1995
- Protein Engineering Research Institute
- Yoshinori Fujiyoshi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Electron microscope
- Patent number 5,289,005
- Issue date Feb 22, 1994
- Jeol Ltd.
- Mikio Naruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen-driving apparatus for electron microscope which tilts and...
- Patent number 5,264,705
- Issue date Nov 23, 1993
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEM sample equipped with an identifying function, focused ion beam...
- Publication number 20040227082
- Publication date Nov 18, 2004
- Tatsuya Adachi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Transmission electron microscope
- Publication number 20040113075
- Publication date Jun 17, 2004
- JEOL Ltd.
- Mikio Naruse
- H01 - BASIC ELECTRIC ELEMENTS