Mikio Saito

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Yamagata-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for examining foreign matters in through holes
- Patent number 7,043,072
- Issue date May 9, 2006
- Seiko Epson Corporation
- Noboru Goto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining foreign matters in through holes
- Patent number 6,906,795
- Issue date Jun 14, 2005
- Seiko Epson Corporation
- Noboru Goto
- G01 - MEASURING TESTING
Information Patent Grant
Methods for managing examination of foreign matters in through holes
- Patent number 6,862,089
- Issue date Mar 1, 2005
- Seiko Epson Corporation
- Noboru Goto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for examining foreign matters in through holes
- Publication number 20030206651
- Publication date Nov 6, 2003
- Noboru Goto
- G01 - MEASURING TESTING
Information Patent Application
Method for managing examination of foreign matters in through holes
- Publication number 20020109837
- Publication date Aug 15, 2002
- Noboru Goto
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for examining foreign matters in through holes
- Publication number 20020051563
- Publication date May 2, 2002
- Noboru Goto
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for examining through holes
- Publication number 20020031250
- Publication date Mar 14, 2002
- Mikio Saito
- G01 - MEASURING TESTING