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Mikio Tanaka
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Failure analysis system of semiconductor memory device
Patent number
6,871,168
Issue date
Mar 22, 2005
NEC Electronics Corporation
Mikio Tanaka
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory LSI failure analysis apparatus and analysis method thereof
Patent number
6,854,080
Issue date
Feb 8, 2005
NEC Electronics Corporation
Mikio Tanaka
G11 - INFORMATION STORAGE
Information
Patent Grant
Camera calibration apparatus
Patent number
6,301,372
Issue date
Oct 9, 2001
NEC Corporation
Mikio Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Camera calibration apparatus
Patent number
6,201,882
Issue date
Mar 13, 2001
NEC Corporation
Mikio Tanaka
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Memory LSI failure analysis apparatus and analysis method thereof
Publication number
20010034864
Publication date
Oct 25, 2001
NEC Corporation
Mikio Tanaka
G11 - INFORMATION STORAGE
Information
Patent Application
Method of analyzing fault occurring in semiconductor device
Publication number
20010010087
Publication date
Jul 26, 2001
Mikio Tanaka
G01 - MEASURING TESTING