Mikio Yamagishi

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Ohme, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device having test circuit
- Patent number 7,145,818
- Issue date Dec 5, 2006
- Hitachi, Ltd.
- Tetsuya Fukuoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable delay circuit and clock signal supply unit using the same
- Patent number 5,497,263
- Issue date Mar 5, 1996
- Hitachi, Ltd.
- Noboru Masuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device capable of outputting a plu...
- Patent number 5,387,809
- Issue date Feb 7, 1995
- Hitachi, Ltd.
- Mikio Yamagishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,365,091
- Issue date Nov 15, 1994
- Hitachi, Ltd.
- Mikio Yamagishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Output circuit
- Patent number 5,038,056
- Issue date Aug 6, 1991
- Hitachi, Ltd.
- Kazuo Koide
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit device
- Publication number 20040213050
- Publication date Oct 28, 2004
- Hitachi, Ltd.
- Tetsuya Fukuoka
- G01 - MEASURING TESTING