Milan Shetty

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Irvine, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Circuits and methods for dynamic allocation of scan test resources
- Patent number 8,839,063
- Issue date Sep 16, 2014
- Texas Instruments Incorporated
- Rubin Ajit Parekhji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUITS AND METHODS FOR DYNAMIC ALLOCATION OF SCAN TEST RESOURCES
- Publication number 20140208177
- Publication date Jul 24, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Rubin Ajit Parekhji
- G01 - MEASURING TESTING