Milen Gateshki

Person

Almelo, NL

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and method
- Patent number 11,035,805
- Issue date Jun 15, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 10,900,912
- Issue date Jan 26, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for X-ray analysis with hybrid control of beam...
- Patent number 10,782,252
- Issue date Sep 22, 2020
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Computed tomography
- Patent number 10,352,881
- Issue date Jul 16, 2019
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative X-ray analysis—matrix thickness correction
- Patent number 9,784,699
- Issue date Oct 10, 2017
- PANalytical B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction imaging
- Patent number 9,506,880
- Issue date Nov 29, 2016
- PANalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Microdiffraction
- Patent number 9,110,003
- Issue date Aug 18, 2015
- PANalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20230270394
- Publication date Aug 31, 2023
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
X-Ray beam shaping apparatus and method
- Publication number 20220163466
- Publication date May 26, 2022
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY ANALYSIS WITH HYBRID CONTROL OF BEAM...
- Publication number 20190317031
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus
- Publication number 20190317029
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus and Method
- Publication number 20190317030
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
High resolution X-ray Diffraction Method and Apparatus
- Publication number 20180259464
- Publication date Sep 13, 2018
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
Computed Tomography
- Publication number 20180180560
- Publication date Jun 28, 2018
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quantitative X-ray Analysis - Matrix thickness correction
- Publication number 20160258890
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Application
Diffraction Imaging
- Publication number 20150003592
- Publication date Jan 1, 2015
- PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
MICRODIFFRACTION
- Publication number 20130243159
- Publication date Sep 19, 2013
- PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

Milen Gateshki

Person

Patents Grantslast 30 patents

X-ray beam shaping apparatus and method

X-ray analysis apparatus and method

X-ray analysis apparatus

Apparatus and method for X-ray analysis with hybrid control of beam...

High resolution X-ray diffraction method and apparatus

Computed tomography

Quantitative X-ray analysis—matrix thickness correction

Diffraction imaging

Microdiffraction

Patents Applicationslast 30 patents

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

Adaptable X-Ray Analysis Apparatus

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

X-Ray beam shaping apparatus and method

APPARATUS AND METHOD FOR X-RAY ANALYSIS WITH HYBRID CONTROL OF BEAM...

X-ray Analysis Apparatus

X-ray Analysis Apparatus and Method

High resolution X-ray Diffraction Method and Apparatus

Computed Tomography

Quantitative X-ray Analysis - Matrix thickness correction

Diffraction Imaging

MICRODIFFRACTION