Milind V. Khandekar

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods for analyzing critical defects in analog integrated circuits
- Patent number 7,415,378
- Issue date Aug 19, 2008
- Texas Instruments Incorporated
- Martin B. Mollat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for analyzing critical defects in analog integrated circuits
- Publication number 20060171221
- Publication date Aug 3, 2006
- Texas Instruments, Inc.
- Martin B. Mollat
- G01 - MEASURING TESTING