Milos Toth

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for laser machining
- Patent number 10,493,559
- Issue date Dec 3, 2019
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Environmental cell for charged particle beam system
- Patent number 9,679,741
- Issue date Jun 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High pressure charged particle beam system
- Patent number 8,921,811
- Issue date Dec 30, 2014
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of depositing material
- Patent number 8,853,078
- Issue date Oct 7, 2014
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for laser machining a sample having a crystalline structure
- Patent number 8,853,592
- Issue date Oct 7, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,629,416
- Issue date Jan 14, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of using nitrogen based compounds to reduce contamination in...
- Patent number 8,617,668
- Issue date Dec 31, 2013
- FEI Company
- Milos Toth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam processing
- Patent number 8,598,542
- Issue date Dec 3, 2013
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Gas-assisted laser ablation
- Patent number 8,524,139
- Issue date Sep 3, 2013
- FEI Compay
- Milos Toth
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Microcalorimetry for X-ray spectroscopy
- Patent number 8,357,894
- Issue date Jan 22, 2013
- FEI Company
- Milos Toth
- G01 - MEASURING TESTING
Information Patent Grant
High resolution plasma etch
- Patent number 8,303,833
- Issue date Nov 6, 2012
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning transmission electron microscope using gas amplification
- Patent number 8,299,432
- Issue date Oct 30, 2012
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,168,961
- Issue date May 1, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multistage gas cascade amplifier
- Patent number 7,791,020
- Issue date Sep 7, 2010
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for charged particle beam instrument
- Patent number 7,541,580
- Issue date Jun 2, 2009
- FEI Company
- William Ralph Knowles
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Masking for Laser Ablation Micromachining
- Publication number 20120200007
- Publication date Aug 9, 2012
- FEI Company
- MARCUS STRAW
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method of Depositing Material
- Publication number 20120196440
- Publication date Aug 2, 2012
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Environmental Cell for Charged Particle Beam System
- Publication number 20120112062
- Publication date May 10, 2012
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method And Apparatus For Laser Machining
- Publication number 20120103945
- Publication date May 3, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and Apparatus for Laser Machining
- Publication number 20110115129
- Publication date May 19, 2011
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
USE OF NITROGEN-BASED REDUCING COMPOUNDS IN BEAM-INDUCED PROCESSING
- Publication number 20110070381
- Publication date Mar 24, 2011
- FEI Company
- Milos Toth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MICROCALORIMETRY FOR X-RAY SPECTROSCOPY
- Publication number 20110064191
- Publication date Mar 17, 2011
- FEI Company
- Milos Toth
- G01 - MEASURING TESTING
Information Patent Application
GAS-ASSISTED LASER ABLATION
- Publication number 20110031655
- Publication date Feb 10, 2011
- FEI Company
- Milos Toth
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM
- Publication number 20110031394
- Publication date Feb 10, 2011
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM PROCESSING
- Publication number 20100224592
- Publication date Sep 9, 2010
- FEI Company
- MILOS TOTH
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM MASKING FOR LASER ABLATION MICROMACHINING
- Publication number 20100127190
- Publication date May 27, 2010
- FEI Company
- MARCUS STRAW
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
- Publication number 20100108881
- Publication date May 6, 2010
- FEI Company
- MILOS TOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISTAGE GAS CASCADE AMPLIFIER
- Publication number 20090242758
- Publication date Oct 1, 2009
- FEI Company
- MAREK UNCOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION PLASMA ETCH
- Publication number 20080314871
- Publication date Dec 25, 2008
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Detector for charged particle beam instrument
- Publication number 20080035861
- Publication date Feb 14, 2008
- FEI Company
- William Ralph Knowles
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus for laser machining

Environmental cell for charged particle beam system

High pressure charged particle beam system

Method of depositing material

Method for laser machining a sample having a crystalline structure

Charged particle beam masking for laser ablation micromachining

Method of using nitrogen based compounds to reduce contamination in...

Charged particle beam processing

Gas-assisted laser ablation

Microcalorimetry for X-ray spectroscopy

High resolution plasma etch

Scanning transmission electron microscope using gas amplification

Charged particle beam masking for laser ablation micromachining

Multistage gas cascade amplifier

Detector for charged particle beam instrument

Patents Applicationslast 30 patents

Charged Particle Beam Masking for Laser Ablation Micromachining

Method of Depositing Material

Environmental Cell for Charged Particle Beam System

Method And Apparatus For Laser Machining

Method and Apparatus for Laser Machining

USE OF NITROGEN-BASED REDUCING COMPOUNDS IN BEAM-INDUCED PROCESSING

MICROCALORIMETRY FOR X-RAY SPECTROSCOPY

GAS-ASSISTED LASER ABLATION

HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM PROCESSING

CHARGED PARTICLE BEAM MASKING FOR LASER ABLATION MICROMACHINING

SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION

MULTISTAGE GAS CASCADE AMPLIFIER

HIGH RESOLUTION PLASMA ETCH

Detector for charged particle beam instrument