SAN DIEGO, CA, US
Information
Patent Grant
QUALCOMM Incorporated
Saravanan Marimuthu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
QUALCOMM Incorporated
Haoyu Xiong
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
QUALCOMM Incorporated
Xia Li
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Texas Instruments Incorporated
Min Chen
G01 - MEASURING TESTING
Information
Patent Grant
Texas Instruments Incorporated
Min Chen
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Nan Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
QUALCOMM Incorporated
Mohammad Reza Kakoee
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Texas Instruments Incorporated
Min Chen
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Saravanan MARIMUTHU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALCOMM Incorporated
Uttkarsh WARDHAN
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Mehdi Saeidi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALCOMM Incorporated
Shan Lu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
QUALCOMM Incorporated
Nan Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEXAS INSTRUMENTS INCORPORATED
MIN CHEN
G01 - MEASURING TESTING
Information
Patent Application
TEXAS INSTRUMENTS INCORPORATED
MIN CHEN
G01 - MEASURING TESTING
Information
Patent Application
TEXAS INSTRUMENTS INCORPORATED
Min Chen
G01 - MEASURING TESTING
