Min-Hsiung Hung

Person

Ta Hsi Town, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating contact structure
- Patent number 12,237,218
- Issue date Feb 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chang-Ting Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature formation and structure
- Patent number 12,087,575
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 11,972,951
- Issue date Apr 30, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming conductive feature including cleaning step
- Patent number 11,955,329
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect structures including a fin structure and a metal cap
- Patent number 11,929,314
- Issue date Mar 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun-Hsien Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device and method of forming the same
- Patent number 11,901,183
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming conductive feature including cleaning step
- Patent number 11,670,499
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature structure including a blocking region
- Patent number 11,532,503
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with salicide layer and method for f...
- Patent number 11,444,173
- Issue date Sep 13, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsiang-Ku Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 11,295,956
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature formation and structure
- Patent number 11,232,945
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation method of semiconductor device structure with metal-semic...
- Patent number 11,222,818
- Issue date Jan 11, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yi-Hsiang Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device and method of forming the same
- Patent number 11,107,690
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with low resistivity contact structure
- Patent number 11,011,611
- Issue date May 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel
- Patent number 10,991,728
- Issue date Apr 27, 2021
- Au Optronics Corporation
- Shin-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature formation and structure
- Patent number 10,847,411
- Issue date Nov 24, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature formation and structure
- Patent number 10,804,097
- Issue date Oct 13, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect formation and structure
- Patent number 10,804,140
- Issue date Oct 13, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive feature formation and structure
- Patent number 10,714,334
- Issue date Jul 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with low resistivity contact structure and met...
- Patent number 10,700,177
- Issue date Jun 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 10,685,842
- Issue date Jun 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation method of interconnection structure of semiconductor device
- Patent number 10,658,234
- Issue date May 19, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated constructing method of cloud manufacturing service and cl...
- Patent number 10,618,137
- Issue date Apr 14, 2020
- National Cheng Kung University
- Chao-Chun Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Metal liner overhang reduction and manufacturing method thereof
- Patent number 9,899,258
- Issue date Feb 20, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Pei-Wen Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for predicting machining quality of machine tool
- Patent number 9,508,042
- Issue date Nov 29, 2016
- National Cheng Kung University
- Haw-Ching Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality prognostics system and method for manufacturing processes
- Patent number 7,493,185
- Issue date Feb 17, 2009
- National Cheng Kung University
- Fan-Tien Cheng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Generic embedded device and mechanism thereof for various intellige...
- Patent number 7,162,394
- Issue date Jan 9, 2007
- National Cheng Kung University
- Fan-Tien Cheng
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME
- Publication number 20240387265
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER LAYER FOR AN INTERCONNECT STRUCTURE
- Publication number 20240379423
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE FEATURE FORMATION AND STRUCTURE
- Publication number 20240363339
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective Formation Of Titanium Silicide And Titanium Nitride By Hy...
- Publication number 20240249948
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Conductive Feature Including Cleaning Step
- Publication number 20240213016
- Publication date Jun 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT STRUCTURES AND MANUFACTURING METHOD THEREOF
- Publication number 20240170381
- Publication date May 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20240136191
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHOD OF FORMING THE SAME
- Publication number 20230395383
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Ting Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES
- Publication number 20230386914
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Chen KO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING CONTACT STRUCTURE
- Publication number 20230360969
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chang-Ting Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Conductive Feature Including Cleaning Step
- Publication number 20230268173
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME
- Publication number 20230223302
- Publication date Jul 13, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER LAYER FOR AN INTERCONNECT STRUCTURE
- Publication number 20230008239
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE
- Publication number 20220376079
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiang-Ku SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Forming Thereof
- Publication number 20220301858
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT STRUCTURES AND MANUFACTURING METHOD THEREOF
- Publication number 20220293503
- Publication date Sep 15, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chun-Hsien HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20220230884
- Publication date Jul 21, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20220139707
- Publication date May 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fin Field-Effect Transistor Device and Method of Forming the Same
- Publication number 20210375630
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20210074580
- Publication date Mar 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20210013033
- Publication date Jan 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH LOW RESISTIVITY CONTACT STRUCTURE
- Publication number 20200335597
- Publication date Oct 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20200294807
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20200176260
- Publication date Jun 4, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY PANEL
- Publication number 20200166793
- Publication date May 28, 2020
- AU OPTRONICS CORPORATION
- Shin-Wei Huang
- G02 - OPTICS
Information Patent Application
FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH METAL-SEMIC...
- Publication number 20200020583
- Publication date Jan 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Hsiang CHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20200006058
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20190385904
- Publication date Dec 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20190355585
- Publication date Nov 21, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Feature Formation and Structure
- Publication number 20190304833
- Publication date Oct 3, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen CHEN
- H01 - BASIC ELECTRIC ELEMENTS

Min-Hsiung Hung

Person

Patents Grantslast 30 patents

Method of fabricating contact structure

Conductive feature formation and structure

Selective formation of titanium silicide and titanium nitride by hy...

Method of forming conductive feature including cleaning step

Interconnect structures including a fin structure and a metal cap

Fin field-effect transistor device and method of forming the same

Method of forming conductive feature including cleaning step

Conductive feature structure including a blocking region

Semiconductor device structure with salicide layer and method for f...

Selective formation of titanium silicide and titanium nitride by hy...

Conductive feature formation and structure

Formation method of semiconductor device structure with metal-semic...

Fin field-effect transistor device and method of forming the same

Semiconductor device with low resistivity contact structure

Display panel

Conductive feature formation and structure

Conductive feature formation and structure

Interconnect formation and structure

Conductive feature formation and structure

Semiconductor device with low resistivity contact structure and met...

Selective formation of titanium silicide and titanium nitride by hy...

Formation method of interconnection structure of semiconductor device

Automated constructing method of cloud manufacturing service and cl...

Metal liner overhang reduction and manufacturing method thereof

Method for predicting machining quality of machine tool

Quality prognostics system and method for manufacturing processes

Generic embedded device and mechanism thereof for various intellige...

Patents Applicationslast 30 patents

CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

BARRIER LAYER FOR AN INTERCONNECT STRUCTURE

CONDUCTIVE FEATURE FORMATION AND STRUCTURE

Selective Formation Of Titanium Silicide And Titanium Nitride By Hy...

Method of Forming Conductive Feature Including Cleaning Step

INTERCONNECT STRUCTURES AND MANUFACTURING METHOD THEREOF

FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME

SEMICONDUCTOR DEVICES AND METHOD OF FORMING THE SAME

METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES

METHOD OF FABRICATING CONTACT STRUCTURE

Method of Forming Conductive Feature Including Cleaning Step

CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

BARRIER LAYER FOR AN INTERCONNECT STRUCTURE

SEMICONDUCTOR DEVICE STRUCTURE

Semiconductor Device and Method of Forming Thereof

INTERCONNECT STRUCTURES AND MANUFACTURING METHOD THEREOF

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

Conductive Feature Formation and Structure

Fin Field-Effect Transistor Device and Method of Forming the Same

Conductive Feature Formation and Structure

Conductive Feature Formation and Structure

SEMICONDUCTOR DEVICE WITH LOW RESISTIVITY CONTACT STRUCTURE

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME

DISPLAY PANEL

FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH METAL-SEMIC...

Conductive Feature Formation and Structure

Conductive Feature Formation and Structure

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

Conductive Feature Formation and Structure