 
                 Sunnyvale, CA, US
 Sunnyvale, CA, US
                     Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Wei  Wu
                                    Wei  Wu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Alexandre M. Bratkovski
                                    Alexandre M. Bratkovski
                                 B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
                                    B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Wei  Yi
                                    Wei  Yi
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Michael Josef Stuke
                                    Michael Josef Stuke
                                 B81 - MICRO-STRUCTURAL TECHNOLOGY
                                    B81 - MICRO-STRUCTURAL TECHNOLOGY
                                 Huei Pei Kuo
                                    Huei Pei Kuo
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Sagi Varghese Mathai
                                    Sagi Varghese Mathai
                                 G06 - COMPUTING CALCULATING COUNTING
                                    G06 - COMPUTING CALCULATING COUNTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Michael J. Stuke
                                    Michael J. Stuke
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Wei  Wu
                                    Wei  Wu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Michael J. Stuke
                                    Michael J. Stuke
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Wei  Wu
                                    Wei  Wu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Huei Pei  Kuo
                                    Huei Pei  Kuo
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Min  Hu
                                    Min  Hu
                                 G02 - OPTICS
                                    G02 - OPTICS
                                 Min  HU
                                    Min  HU
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Alexandre M. Bratkovski
                                    Alexandre M. Bratkovski
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Wei  Wu
                                    Wei  Wu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Wei  WU
                                    Wei  WU
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Wei  Wu
                                    Wei  Wu
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Wei  Yi
                                    Wei  Yi
                                 B82 - NANO-TECHNOLOGY
                                    B82 - NANO-TECHNOLOGY
                                 Hewlett-Packard Development Company, L.P.
                                    Hewlett-Packard Development Company, L.P.
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Sagi Varghese  Mathai
                                    Sagi Varghese  Mathai
                                 G06 - COMPUTING CALCULATING COUNTING
                                    G06 - COMPUTING CALCULATING COUNTING
                                 Michael Josef  Stuke
                                    Michael Josef  Stuke
                                 Michael J.  Stuke
                                    Michael J.  Stuke
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Huei Pei  Kuo
                                    Huei Pei  Kuo
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Michael Josef  Stuke
                                    Michael Josef  Stuke
                                 B81 - MICRO-STRUCTURAL TECHNOLOGY
                                    B81 - MICRO-STRUCTURAL TECHNOLOGY
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Wei  Wu
                                    Wei  Wu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Michael J.  Stuke
                                    Michael J.  Stuke
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Zhiyong  Li
                                    Zhiyong  Li
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Min  HU
                                    Min  HU
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Wei  WU
                                    Wei  WU
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Fung Suong  Ou
                                    Fung Suong  Ou
                                 G02 - OPTICS
                                    G02 - OPTICS
                                 Min  HU
                                    Min  HU
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Michael J.  Stuke
                                    Michael J.  Stuke
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Huei Pei  Kuo
                                    Huei Pei  Kuo
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING
                                 Min  Hu
                                    Min  Hu
                                 G01 - MEASURING TESTING
                                    G01 - MEASURING TESTING