Min-Kuang Chang

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Taoyuan Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 11,841,381
- Issue date Dec 12, 2023
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Electrical component testing method and test probe
- Patent number 11,573,265
- Issue date Feb 7, 2023
- CHROMA ATE INC.
- Min-Hung Chang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing light-emitting devices
- Patent number 7,804,589
- Issue date Sep 28, 2010
- Chroma Ate Inc.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Heat-dispersing module of electronic device
- Patent number 6,930,883
- Issue date Aug 16, 2005
- Delta Electronics, Inc.
- Hung Chang Hsieh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105201
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105061
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL COMPONENT TESTING METHOD AND TEST PROBE
- Publication number 20200284834
- Publication date Sep 10, 2020
- Min-Hung CHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES
- Publication number 20090309606
- Publication date Dec 17, 2009
- CHROMA ATE INC.
- I-SHIH TSENG
- G01 - MEASURING TESTING
Information Patent Application
Heat-dispersing module of electronic device
- Publication number 20040252457
- Publication date Dec 16, 2004
- DELTA ELECTRONICS, INC.
- Hung-Chang Hsieh
- G06 - COMPUTING CALCULATING COUNTING