Min Kuang Lee

Follow

Person

Keelung City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Test method for screening local bit-line defects in a memory array
- Patent number 8,498,168
- Issue date Jul 30, 2013
- Macronix International Co., Ltd.
- Yin Chin Huang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD FOR SCREENING LOCAL BIT-LINE DEFECTS IN A MEMORY ARRAY
- Publication number 20120263002
- Publication date Oct 18, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Yin Chin Huang
- G11 - INFORMATION STORAGE