Membership
Tour
Register
Log in
Min Namkung
Follow
Person
Tabb, VA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Magnetoresistive flux focusing eddy current flaw detection
Patent number
6,888,346
Issue date
May 3, 2005
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication of molded magnetic article
Patent number
6,190,589
Issue date
Feb 20, 2001
The United States of America as represented by the administrator of the Natio...
Robert G. Bryant
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Molded magnetic article
Patent number
6,054,210
Issue date
Apr 25, 2000
The United States of America as represented by the administrator of the Natio...
Robert G. Bryant
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Radially focused eddy current sensor for detection of longitudinal...
Patent number
5,942,894
Issue date
Aug 24, 1999
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Thickness gauging of single-layer conductive materials with two-poi...
Patent number
5,847,562
Issue date
Dec 8, 1998
The United States of America as represented by the administrator of the Natio...
James P. Fulton
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current method for fatigue testing
Patent number
5,698,977
Issue date
Dec 16, 1997
The United States of America as represented by the administrator of the Natio...
John W. Simpson
G01 - MEASURING TESTING
Information
Patent Grant
Rotating flux-focusing eddy current probe for flaw detection
Patent number
5,648,721
Issue date
Jul 15, 1997
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Flux focusing eddy current probe
Patent number
5,617,024
Issue date
Apr 1, 1997
The United States of America as represented by the United States National Aer...
John W. Simpson
G01 - MEASURING TESTING
Information
Patent Grant
High speed thin plate fatigue crack monitor
Patent number
5,493,511
Issue date
Feb 20, 1996
Administrator, National Aeronautics and Space Administration
Buzz A. Wincheski
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Grant
Method of characterizing residual stress in ferromagnetic materials...
Patent number
5,164,669
Issue date
Nov 17, 1992
The United States of America as represented by the administrator of the Natio...
Min Namkung
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for using magneto-acoustic remanence to determ...
Patent number
5,121,058
Issue date
Jun 9, 1992
Administrator, National Aeronautics and Space Administration
Sidney G. Allison
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic remanence method and apparatus to test materials for embri...
Patent number
5,117,184
Issue date
May 26, 1992
Sidney G. Allison
G01 - MEASURING TESTING
Information
Patent Grant
Magneto acoustic emission method for testing materials for embrittl...
Patent number
5,109,195
Issue date
Apr 28, 1992
Sidney G. Allison
G01 - MEASURING TESTING
Information
Patent Grant
Magneto acoustic emission apparatus for testing materials for embri...
Patent number
4,912,411
Issue date
Mar 27, 1990
The United States of America as represented by the administrator of the Natio...
Sidney G. Allison
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Magnetoresistive flux focusing eddy current flaw detection
Publication number
20020130659
Publication date
Sep 19, 2002
National Aeronautics & Space Administration
Russell A. Wincheski
G01 - MEASURING TESTING