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Patents Grants
last 30 patents
Information
Patent Grant
Multipurpose decapsulation holder and method for a ball grid array...
Patent number
7,772,030
Issue date
Aug 10, 2010
Semiconductor Manufacturing International (Shanghai) Corporation
Chun Kui Ji
G01 - MEASURING TESTING
Information
Patent Grant
Method of preparing a sample for transmission electron microscopy
Patent number
7,649,173
Issue date
Jan 19, 2010
Semiconductor Manufacturing International (Shanghai) Corporation
Jianqiang Hu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MULTIPURPOSE DECAPSULATION HOLDER AND METHOD FOR A BALL GRID ARRAY...
Publication number
20080142482
Publication date
Jun 19, 2008
Semiconductor Manufacturing International (Shanghai) Corporation
Chun Kui Ji
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY
Publication number
20080078742
Publication date
Apr 3, 2008
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (Shangha i) CORPORATION
Jianqiang HU
G01 - MEASURING TESTING