Min-Seong CHU

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for clustering images
- Patent number 12,013,918
- Issue date Jun 18, 2024
- SAMSUNG SDS CO., LTD.
- Joo Yeon Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process management method and apparatus
- Patent number 11,823,926
- Issue date Nov 21, 2023
- SAMSUNG SDS CO., LTD.
- Ji Hoon Kang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for detecting defect pattern on wafer based on...
- Patent number 11,816,579
- Issue date Nov 14, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting defect pattern on wafer based on...
- Patent number 11,587,222
- Issue date Feb 21, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process management method and apparatus
- Patent number 11,222,798
- Issue date Jan 11, 2022
- SAMSUNG SDS CO., LTD.
- Ji Hoon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Content scheduling method and apparatus
- Patent number 10,861,048
- Issue date Dec 8, 2020
- SAMSUNG SDS CO., LTD.
- Ji Hoon Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Receiver, system including the same, and calibration method thereof
- Patent number 9,059,825
- Issue date Jun 16, 2015
- SK Hynix Inc.
- Han-Kyu Chi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...
- Publication number 20230177347
- Publication date Jun 8, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CLUSTERING IMAGES
- Publication number 20220253641
- Publication date Aug 11, 2022
- SAMSUNG SDS CO., LTD.
- Joo Yeon CHUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS MANAGEMENT METHOD AND APPARATUS
- Publication number 20220084853
- Publication date Mar 17, 2022
- SAMSUNG SDS CO., LTD.
- Ji Hoon KANG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...
- Publication number 20200380655
- Publication date Dec 3, 2020
- SAMSUNG SDS CO., LTD.
- Min Sik CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS MANAGEMENT METHOD AND APPARATUS
- Publication number 20190051547
- Publication date Feb 14, 2019
- SAMSUNG SDS CO., LTD.
- Ji Hoon KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTENT SCHEDULING METHOD AND APPARATUS
- Publication number 20180108041
- Publication date Apr 19, 2018
- SAMSUNG SDS CO., LTD.
- Ji Hoon KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTENT SCHEDULING METHOD AND APPARATUS IN MULTI-CONTENT REPRODUCIN...
- Publication number 20180108033
- Publication date Apr 19, 2018
- SAMSUNG SDS CO., LTD.
- Young Hyun CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MODELLING THREE DIMENSIONAL SHAPE
- Publication number 20160259325
- Publication date Sep 8, 2016
- SAMSUNG SDS CO., LTD.
- Nak-Yong YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECEIVER, SYSTEM INCLUDING THE SAME, AND CALIBRATION METHOD THEREOF
- Publication number 20150139289
- Publication date May 21, 2015
- SK HYNIX INC.
- Han-Kyu CHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Min-Seong CHU

Person

Patents Grantslast 30 patents

Method and apparatus for clustering images

Process management method and apparatus

Method and apparatus for detecting defect pattern on wafer based on...

Method and apparatus for detecting defect pattern on wafer based on...

Process management method and apparatus

Content scheduling method and apparatus

Receiver, system including the same, and calibration method thereof

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...

METHOD AND APPARATUS FOR CLUSTERING IMAGES

PROCESS MANAGEMENT METHOD AND APPARATUS

METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...

PROCESS MANAGEMENT METHOD AND APPARATUS

CONTENT SCHEDULING METHOD AND APPARATUS

CONTENT SCHEDULING METHOD AND APPARATUS IN MULTI-CONTENT REPRODUCIN...

APPARATUS AND METHOD FOR MODELLING THREE DIMENSIONAL SHAPE

RECEIVER, SYSTEM INCLUDING THE SAME, AND CALIBRATION METHOD THEREOF