Min-Tar LIU

Person

Jhubei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring device inside through-silicon via s...
- Patent number 12,159,809
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring device inside through-silicon via s...
- Patent number 11,955,392
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bump layout for coplanarity improvement
- Patent number 11,211,318
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ling-Wei Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring capacitances of capacitors
- Patent number 9,086,450
- Issue date Jul 21, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min-Tar Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for device parameter measurement
- Patent number 8,779,796
- Issue date Jul 15, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tseng Chin Luo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20240395640
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20230369144
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20220367299
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUMP LAYOUT FOR COPLANARITY IMPROVEMENT
- Publication number 20200105654
- Publication date Apr 2, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ling-Wei Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Measuring Capacitances of Capacitors
- Publication number 20120084033
- Publication date Apr 5, 2012
- Min-Tar Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR DEVICE PARAMETER MEASUREMENT
- Publication number 20120074981
- Publication date Mar 29, 2012
- Taiwan Semiconductor Manufacturing Co., LTD
- Tseng Chin Luo
- G01 - MEASURING TESTING

Min-Tar LIU

Person

Patents Grantslast 30 patents

System and method for measuring device inside through-silicon via s...

System and method for measuring device inside through-silicon via s...

Bump layout for coplanarity improvement

Method for measuring capacitances of capacitors

Method and apparatus for device parameter measurement

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

BUMP LAYOUT FOR COPLANARITY IMPROVEMENT

Method for Measuring Capacitances of Capacitors

METHOD AND APPARATUS FOR DEVICE PARAMETER MEASUREMENT