Minako Yoshida

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device with integrally formed light emitting device and...
- Patent number 7,253,443
- Issue date Aug 7, 2007
- Advantest Corporation
- Minako Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus, processing method and position detecting device
- Patent number 7,193,728
- Issue date Mar 20, 2007
- Advantest Corporation
- Masayoshi Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing micro contact structure and contact probe using...
- Patent number 6,174,744
- Issue date Jan 16, 2001
- Advantest Corp.
- Takashi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Micro contact pin structure with a piezoelectric element and probe...
- Patent number 6,072,190
- Issue date Jun 6, 2000
- Advantest Corp.
- Takashi Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Processing apparatus, processing method and position detecting device
- Publication number 20040027586
- Publication date Feb 12, 2004
- Masayoshi Ichikawa
- G01 - MEASURING TESTING
Information Patent Application
Electronic device and supporting member
- Publication number 20040016930
- Publication date Jan 29, 2004
- Minako Yoshida
- H01 - BASIC ELECTRIC ELEMENTS