TREA

Minami UCHIHO

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  • Tokyo, JP
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Patents Applicationslast 30 patents

  • Information Patent Application

    INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD
    • Publication number 20250046569
    • Publication date Feb 6, 2025
    • Hitachi High-Tech Corporation
    • Yasuhiro SHIRASAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam System
    • Publication number 20240177964
    • Publication date May 30, 2024
    • Hitachi High-Tech Corporation
    • Heita KIMIZUKA
    • H01 - BASIC ELECTRIC ELEMENTS