MINCENT LEE

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TAIPEI CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Alignment testing for tiered semiconductor structure
- Patent number 11,231,453
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Alignment testing for tiered semiconductor structure
- Patent number 10,641,819
- Issue date May 5, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Alignment testing for tiered semiconductor structure
- Patent number 10,073,135
- Issue date Sep 11, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated fan-out pillar probe system
- Patent number 9,915,699
- Issue date Mar 13, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Alignment testing for tiered semiconductor structure
- Patent number 9,658,281
- Issue date May 23, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for repairing memory and system thereof
- Patent number 8,095,832
- Issue date Jan 10, 2012
- National Tsing Hua University
- Mincent Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT TESTING FOR TIERED SEMICONDUCTOR STRUCTURE
- Publication number 20200264227
- Publication date Aug 20, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT TESTING FOR TIERED SEMICONDUCTOR STRUCTURE
- Publication number 20190025368
- Publication date Jan 24, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT TESTING FOR TIERED SEMICONDUCTOR STRUCTURE
- Publication number 20170254849
- Publication date Sep 7, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED FAN-OUT PILLAR PROBE SYSTEM
- Publication number 20160077147
- Publication date Mar 17, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT TESTING FOR TIERED SEMICONDUCTOR STRUCTURE
- Publication number 20150115986
- Publication date Apr 30, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REPAIRING MEMORY AND SYSTEM THEREOF
- Publication number 20090119537
- Publication date May 7, 2009
- National Tsing Hua University
- MINCENT LEE
- G11 - INFORMATION STORAGE