Mine Araki

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 7,705,302
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device with DF-STEM image valuation method
- Patent number 7,459,683
- Issue date Dec 2, 2008
- Hitachi High-Technologies Corporation
- Mine Araki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope
- Publication number 20080191135
- Publication date Aug 14, 2008
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam device with DF-STEM image valuation method
- Publication number 20070085007
- Publication date Apr 19, 2007
- Hitachi High-Technologies Corporation
- Mine Araki
- H01 - BASIC ELECTRIC ELEMENTS