Mine Nakagawa

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 7,964,845
- Issue date Jun 21, 2011
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,456,403
- Issue date Nov 25, 2008
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and sample observing method using it
- Patent number 6,963,067
- Issue date Nov 8, 2005
- Hitachi High-Technologies Corporation
- Shuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 6,963,069
- Issue date Nov 8, 2005
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged particle beam device
- Publication number 20090050803
- Publication date Feb 26, 2009
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20070235645
- Publication date Oct 11, 2007
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20040238752
- Publication date Dec 2, 2004
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and sample observing method using it
- Publication number 20040188611
- Publication date Sep 30, 2004
- Shuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS