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Taipei, TW
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Patents Grants
last 30 patents
Information
Patent Grant
High-voltage isolator testing
Patent number
10,871,514
Issue date
Dec 22, 2020
Texas Instruments Incorporated
Chi-Tsung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Automatic selective retest for multi-site testers
Patent number
7,650,255
Issue date
Jan 19, 2010
Texas Instruments Incorporated
Chi Tsung Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH-VOLTAGE ISOLATOR TESTING
Publication number
20170328947
Publication date
Nov 16, 2017
TEXAS INSTRUMENTS INCORPORATED
Chi-Tsung Lee
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC SELECTIVE RETEST FOR MULTI-SITE TESTERS
Publication number
20090276175
Publication date
Nov 5, 2009
Texas Instruments Inc.
Chi Tsung Lee
G01 - MEASURING TESTING