Ming Chun Chen

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to accurately determine classification codes for defects dur...
- Patent number 6,185,511
- Issue date Feb 6, 2001
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Critical area cost disposition feedback system
- Patent number 6,174,738
- Issue date Jan 16, 2001
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Disposition tool for factory process control
- Patent number 6,154,711
- Issue date Nov 28, 2000
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for process data association using LaPlace Everett interpola...
- Patent number 6,098,024
- Issue date Aug 1, 2000
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic recipe adjust and download based on process control window
- Patent number 6,041,270
- Issue date Mar 21, 2000
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic defect reclassification of known propagator defects
- Patent number 6,035,244
- Issue date Mar 7, 2000
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer optical scanning system and method using swath-...
- Patent number 6,011,619
- Issue date Jan 4, 2000
- Advanced Micro Devices
- Paul J. Steffan
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent usage of first pass defect data for improved statistica...
- Patent number 5,999,003
- Issue date Dec 7, 1999
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- G01 - MEASURING TESTING
Information Patent Grant
Ion implantation feedback monitor using reverse process simulation...
- Patent number 5,972,728
- Issue date Oct 26, 1999
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic defect classification (ADC) reclassification engine
- Patent number 5,966,459
- Issue date Oct 12, 1999
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent adc reclassification of previously classified propagato...
- Patent number 5,946,213
- Issue date Aug 31, 1999
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement for improving defect scanner sensitivity and scanning d...
- Patent number 5,917,332
- Issue date Jun 29, 1999
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle communication device
- Patent number 5,905,434
- Issue date May 18, 1999
- Paul J. Steffan
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and apparatus for inspecting manufactured products for defec...
- Patent number 5,896,294
- Issue date Apr 20, 1999
- Advanced Micro Devices, Inc.
- Wanyee Apple Chow
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamic process window control using simulated wet data from curren...
- Patent number 5,866,437
- Issue date Feb 2, 1999
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic defect classification individual defect predicate value r...
- Patent number 5,862,055
- Issue date Jan 19, 1999
- Advanced Micro Devices, Inc.
- Ming Chun Chen
- G06 - COMPUTING CALCULATING COUNTING

Ming Chun Chen

Person

Patents Grantslast 30 patents

Method to accurately determine classification codes for defects dur...

Critical area cost disposition feedback system

Disposition tool for factory process control

System for process data association using LaPlace Everett interpola...

Automatic recipe adjust and download based on process control window

Automatic defect reclassification of known propagator defects

Semiconductor wafer optical scanning system and method using swath-...

Intelligent usage of first pass defect data for improved statistica...

Ion implantation feedback monitor using reverse process simulation...

Automatic defect classification (ADC) reclassification engine

Intelligent adc reclassification of previously classified propagato...

Arrangement for improving defect scanner sensitivity and scanning d...

Vehicle communication device

Method and apparatus for inspecting manufactured products for defec...

Dynamic process window control using simulated wet data from curren...

Automatic defect classification individual defect predicate value r...