Ming Di

Person

Hayward, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,378,451
- Issue date Jul 5, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,770,362
- Issue date Sep 8, 2020
- KLA Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,410,935
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calculated electrical performance metrics for process monitoring an...
- Patent number 10,079,183
- Issue date Sep 18, 2018
- KLA-Tenor Corporation
- Xiang Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 9,595,481
- Issue date Mar 14, 2017
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of composition for thin films
- Patent number 9,442,063
- Issue date Sep 13, 2016
- KLA-Tencor Corporation
- Ming Di
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods And Systems For Nanoscale Imaging Based On Second Harmonic...
- Publication number 20240353352
- Publication date Oct 24, 2024
- KLA Corporation
- Qiang Zhao
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE-BASED DEFECT INSPECTION USING SECOND HARMONIC GENERATION
- Publication number 20240221149
- Publication date Jul 4, 2024
- KLA Corporation
- Qiang Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurements Of Semiconductor Structures Based On Spectral Differen...
- Publication number 20240186191
- Publication date Jun 6, 2024
- KLA Corporation
- Ming Di
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION
- Publication number 20240176206
- Publication date May 30, 2024
- KLA Corporation
- Qiang Zhao
- G02 - OPTICS
Information Patent Application
Methods And Systems For Systematic Error Compensation Across A Flee...
- Publication number 20240053280
- Publication date Feb 15, 2024
- KLA Corporation
- Ming Di
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20220349752
- Publication date Nov 3, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF BANDGAP ANALYSIS AND MODELING FOR HIGH K METAL GATE
- Publication number 20190242938
- Publication date Aug 8, 2019
- GLOBALFOUNDRIES INC.
- Min DAI
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20190041266
- Publication date Feb 7, 2019
- KLA-Tencor Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
Calculated Electrical Performance Metrics For Process Monitoring An...
- Publication number 20150006097
- Publication date Jan 1, 2015
- KLA-Tencor Corporation
- Xiang Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT OF COMPOSITION FOR THIN FILMS
- Publication number 20130006539
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- Ming Di
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Bandgap measurements of patterned film stacks using spectroscopic m...

Bandgap measurements of patterned film stacks using spectroscopic m...

Dispersion model for band gap tracking

Dispersion model for band gap tracking

Calculated electrical performance metrics for process monitoring an...

Dispersion model for band gap tracking

Measurement of composition for thin films

Patents Applicationslast 30 patents

Methods And Systems For Nanoscale Imaging Based On Second Harmonic...

INTERFACE-BASED DEFECT INSPECTION USING SECOND HARMONIC GENERATION

Measurements Of Semiconductor Structures Based On Spectral Differen...

INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION

Methods And Systems For Systematic Error Compensation Across A Flee...

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

METHODS OF BANDGAP ANALYSIS AND MODELING FOR HIGH K METAL GATE

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

Calculated Electrical Performance Metrics For Process Monitoring An...

MEASUREMENT OF COMPOSITION FOR THIN FILMS