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Panchiao City, TW
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Patents Grants
last 30 patents
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Patent Grant
Incremental offset measurement instrument
Patent number
6,772,528
Issue date
Aug 10, 2004
Nan Ya Technology Corporation
Ming Fa Tsai
G01 - MEASURING TESTING
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Patent Grant
Radar signal processing chip
Patent number
6,081,225
Issue date
Jun 27, 2000
Chung Shan Institute of Science & Technology
Ming-fa Tsai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Incremental offset measurement instrument
Publication number
20040016140
Publication date
Jan 29, 2004
Nan Ya Technology Corporation
Ming Fa Tsai
G01 - MEASURING TESTING