Ming Lei

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Irvine, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Second Harmonic Generation (SHG) optical inspection system designs
- Patent number 11,946,863
- Issue date Apr 2, 2024
- FemtoMetrix, Inc.
- Ming Lei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SECOND HARMONIC GENERATION (SHG) OPTICAL INSPECTION SYSTEM DESIGNS
- Publication number 20200110029
- Publication date Apr 9, 2020
- FemtoMetrix, Inc.
- Ming Lei
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTO...
- Publication number 20200088784
- Publication date Mar 19, 2020
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE
- Publication number 20200057104
- Publication date Feb 20, 2020
- SK HYNIX INC.
- Seongmin Ma
- G01 - MEASURING TESTING