Ming Xue

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit device testing in an inert gas
- Patent number 10,473,712
- Issue date Nov 12, 2019
- Infineon Technologies AG
- Nam Teck Shannon Teo
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel probe plate for semiconductor package test systems
- Patent number 9,435,825
- Issue date Sep 6, 2016
- Infineon Technologies AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive test device and method for capacitive testing a component
- Patent number 9,250,293
- Issue date Feb 2, 2016
- Infineon Technologies AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive test method, apparatus and system for semiconductor pack...
- Patent number 9,121,884
- Issue date Sep 1, 2015
- Infineon Technologies AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and a method for measuring a chip-to-chip-carrier...
- Patent number 8,933,722
- Issue date Jan 13, 2015
- Infineon Technologies AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and a method for measuring a chip-to-chip-carrier...
- Patent number 8,896,320
- Issue date Nov 25, 2014
- Infineon Technologies AG
- Franz Schoenberger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT DEVICE TESTING IN AN INERT GAS
- Publication number 20180180666
- Publication date Jun 28, 2018
- INFINEON TECHNOLOGIES AG
- Nam Teck Shannon Teo
- G01 - MEASURING TESTING
Information Patent Application
Multi-Channel Probe Plate for Semiconductor Package Test Systems
- Publication number 20150331013
- Publication date Nov 19, 2015
- INFINEON TECHNOLOGIES AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Method, Apparatus and System for Semiconductor Pack...
- Publication number 20140361803
- Publication date Dec 11, 2014
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Device and Method for Capacitive Testing a Component
- Publication number 20140009181
- Publication date Jan 9, 2014
- INFINEON TECHNOLOGIES AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...
- Publication number 20130049766
- Publication date Feb 28, 2013
- INFINEON TECHNOLOGIES AG
- Franz Schoenberger
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...
- Publication number 20130049792
- Publication date Feb 28, 2013
- INFINEON TECHNOLOGIES AG
- Ming Xue
- G01 - MEASURING TESTING