Ming Zhang

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Wayland, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Backscatter energy analysis for classification of materials based o...
- Patent number 8,442,186
- Issue date May 14, 2013
- American Science and Engineering, Inc.
- Peter Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping based on scattered penetrating radiation
- Patent number 8,275,092
- Issue date Sep 25, 2012
- American Science and Engineering, Inc.
- Ming Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Backscatter Energy Analysis for Classification of Materials based o...
- Publication number 20120201356
- Publication date Aug 9, 2012
- American Science and Engineering, Inc.
- Peter Rothschild
- G01 - MEASURING TESTING