Mingda Wang

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dielectric coated ion transfer device for mass spectrometry
- Patent number 10,546,738
- Issue date Jan 28, 2020
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for soft electron ionization and related systems and met...
- Patent number 10,176,977
- Issue date Jan 8, 2019
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole ion transport apparatus and related methods
- Patent number 8,124,930
- Issue date Feb 28, 2012
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical structure-insensitive method and apparatus for dissociatin...
- Patent number 7,842,918
- Issue date Nov 30, 2010
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample ionization at above-vacuum pressures
- Patent number 7,564,029
- Issue date Jul 21, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional electrode constructions for ion processing
- Patent number 7,501,623
- Issue date Mar 10, 2009
- Varian, Inc.
- Roger Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution ion isolation utilizing broadband waveform signals
- Patent number 7,378,648
- Issue date May 27, 2008
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for manipulation of ions and methods of making apparatus
- Patent number 7,329,879
- Issue date Feb 12, 2008
- Agilent Technologies, Inc.
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-axis electron impact ion source
- Patent number 7,259,379
- Issue date Aug 21, 2007
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole ion mass filter having rotating electric field
- Patent number 7,183,545
- Issue date Feb 27, 2007
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-axis electron impact ion source
- Patent number 6,998,622
- Issue date Feb 14, 2006
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for manipulation of ions and methods of making apparatus
- Patent number 6,723,986
- Issue date Apr 20, 2004
- Agilent Technologies, Inc.
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Higher pressure ion source for two dimensional radio-frequency quad...
- Patent number 5,942,752
- Issue date Aug 24, 1999
- Hewlett-Packard Company
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass scanning method using an ion trap mass spectrometer
- Patent number 5,714,755
- Issue date Feb 3, 1998
- Varian Associates, Inc.
- Gregory J. Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface coating to improve performance of ion trap mass spectrometers
- Patent number 5,633,497
- Issue date May 27, 1997
- Varian Associates, Inc.
- Robert D. Brittain
- G01 - MEASURING TESTING
Information Patent Grant
Method of selective ion trapping for quadrupole ion trap mass spect...
- Patent number 5,457,315
- Issue date Oct 10, 1995
- Varian Associates, Inc.
- Gregory J. Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS.sup.n using CID
- Patent number 5,404,011
- Issue date Apr 4, 1995
- Varian Associates, Inc.
- Gregory J. Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer method and apparatus for improved sensit...
- Patent number 5,291,017
- Issue date Mar 1, 1994
- Varian Associates, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Ionization (EI) Utilizing Different EI Energies
- Publication number 20180277348
- Publication date Sep 27, 2018
- Agilent Technologies, Inc.
- Harry F. Prest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF ANALYTE DERIVATIZATION AND ENHANCED SOFT IONIZATION
- Publication number 20170089915
- Publication date Mar 30, 2017
- Agilent Technologies, Inc.
- Mingda Wang
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE FOR SOFT ELECTRON IONIZATION AND RELATED SYSTEMS AND MET...
- Publication number 20160172146
- Publication date Jun 16, 2016
- Agilent Technologies, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES
- Publication number 20140374583
- Publication date Dec 25, 2014
- Harry F. Prest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPOLE ION TRANSPORT APPARATUS AND RELATED METHODS
- Publication number 20100308218
- Publication date Dec 9, 2010
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample ionization at above-vacuum pressures
- Publication number 20090045330
- Publication date Feb 19, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chemical structure-insensitive method and apparatus for dissociatin...
- Publication number 20080217527
- Publication date Sep 11, 2008
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-dimensional electrode constructions for ion processing
- Publication number 20070176095
- Publication date Aug 2, 2007
- Roger Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-resolution ion isolation utilizing broadband waveform signals
- Publication number 20070084994
- Publication date Apr 19, 2007
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole ion mass filter having rotating electric field
- Publication number 20060243903
- Publication date Nov 2, 2006
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPOLE ION MASS FILTER HAVING ROTATING ELECTRIC FIELD
- Publication number 20060219933
- Publication date Oct 5, 2006
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
On-axis electron impact ion source
- Publication number 20060145072
- Publication date Jul 6, 2006
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for manipulation of ions and methods of making apparatus
- Publication number 20050167584
- Publication date Aug 4, 2005
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for manipulation of ions and methods of making apparatus
- Publication number 20040178342
- Publication date Sep 16, 2004
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for manipulation of ions and methods of making apparatus
- Publication number 20030178564
- Publication date Sep 25, 2003
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS

Mingda Wang

Person

Patents Grantslast 30 patents

Dielectric coated ion transfer device for mass spectrometry

Ion source for soft electron ionization and related systems and met...

Multipole ion transport apparatus and related methods

Chemical structure-insensitive method and apparatus for dissociatin...

Sample ionization at above-vacuum pressures

Two-dimensional electrode constructions for ion processing

High-resolution ion isolation utilizing broadband waveform signals

Apparatus for manipulation of ions and methods of making apparatus

On-axis electron impact ion source

Multipole ion mass filter having rotating electric field

On-axis electron impact ion source

Apparatus for manipulation of ions and methods of making apparatus

Higher pressure ion source for two dimensional radio-frequency quad...

Mass scanning method using an ion trap mass spectrometer

Surface coating to improve performance of ion trap mass spectrometers

Method of selective ion trapping for quadrupole ion trap mass spect...

MS.sup.n using CID

Ion trap mass spectrometer method and apparatus for improved sensit...

Patents Applicationslast 30 patents

Electron Ionization (EI) Utilizing Different EI Energies

METHODS OF ANALYTE DERIVATIZATION AND ENHANCED SOFT IONIZATION

ION SOURCE FOR SOFT ELECTRON IONIZATION AND RELATED SYSTEMS AND MET...

ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES

MULTIPOLE ION TRANSPORT APPARATUS AND RELATED METHODS

Sample ionization at above-vacuum pressures

Chemical structure-insensitive method and apparatus for dissociatin...

Two-dimensional electrode constructions for ion processing

High-resolution ion isolation utilizing broadband waveform signals

Multipole ion mass filter having rotating electric field

MULTIPOLE ION MASS FILTER HAVING ROTATING ELECTRIC FIELD

On-axis electron impact ion source

Apparatus for manipulation of ions and methods of making apparatus

Apparatus for manipulation of ions and methods of making apparatus

Apparatus for manipulation of ions and methods of making apparatus