MingShen KUO

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting the circular uniformity of the semiconductor ci...
- Patent number 8,865,482
- Issue date Oct 21, 2014
- Shanghai Huali Microelectronics Corporation
- Kai Wang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETECTING THE CIRCULAR UNIFORMITY OF THE SEMICONDUCTOR CI...
- Publication number 20140127835
- Publication date May 8, 2014
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Kai WANG
- H01 - BASIC ELECTRIC ELEMENTS