Mingsheng Guo

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring alignment between contact holes and polycryst...
- Patent number 9,080,863
- Issue date Jul 14, 2015
- SHANGAI HUALI MICROELECTRONICS CORPORATION
- Qiliang Ni
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing silicon nanowire devices
- Patent number 8,507,369
- Issue date Aug 13, 2013
- Shanghai Huali Microelectronics Corporation
- Xubin Jing
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MONITORING ALIGNMENT BETWEEN CONTACT HOLES AND POLYCRYST...
- Publication number 20130342842
- Publication date Dec 26, 2013
- Shangai Huali Microelectronics Corporation
- Qiliang Ni
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING DEVICES IN SEMICONDUCTOR PROCESS
- Publication number 20130137196
- Publication date May 30, 2013
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Hunglin CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR YIELD MANAGEMENT SYSTEM
- Publication number 20130138239
- Publication date May 30, 2013
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Hunglin CHEN
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD FOR PRODUCING SILICON NANOWIRE DEVICES
- Publication number 20130102134
- Publication date Apr 25, 2013
- Shanghai Huali Microelectronics Corporation
- Xubin JING
- B82 - NANO-TECHNOLOGY