Minho Rim

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND METHOD OF INSPECTING A SUBSTRATE...
- Publication number 20250147096
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Yang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE INSPECTION DEVICE
- Publication number 20250123243
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Hyeon Bo SHIM
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING