Minjong Kim

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for sub-assembly error detection in high volta...
- Patent number 8,222,910
- Issue date Jul 17, 2012
- Atmel Corporation
- Dilip Sangam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARTUS FOR SUB-ASSEMBLY ERROR DETECTION IN HIGH VOLTAG...
- Publication number 20110012609
- Publication date Jan 20, 2011
- mSilica Inc
- Dilip S
- G01 - MEASURING TESTING