Minkook KIM

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Goyang-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting semiconductor device and method of fabricating...
- Patent number 9,466,537
- Issue date Oct 11, 2016
- Samsung Electronics Co., Ltd.
- Minkook Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection system and methods of inspecting a semicon...
- Patent number 9,455,121
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Hyunwoo Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...
- Publication number 20160204041
- Publication date Jul 14, 2016
- Samsung Electronics Co., Ltd.
- Minkook KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...
- Publication number 20160086769
- Publication date Mar 24, 2016
- Hyunwoo KIM
- H01 - BASIC ELECTRIC ELEMENTS