Minori Noguchi

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Support system for specified inspection, support method for specifi...
- Patent number 11,561,184
- Issue date Jan 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 9,551,670
- Issue date Jan 24, 2017
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Inspection equipment and inspection method
- Patent number 9,261,475
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,823,929
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system
- Patent number 8,804,109
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defect in object surface
- Patent number 8,760,643
- Issue date Jun 24, 2014
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 8,729,514
- Issue date May 20, 2014
- Hitachi High-Technologies Corporaation
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,559,000
- Issue date Oct 15, 2013
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,542,354
- Issue date Sep 24, 2013
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Defects inspecting apparatus and defects inspecting method
- Patent number 8,508,727
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defect on object surface
- Patent number 8,482,728
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Sachio Uto
- B08 - CLEANING
Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 8,467,048
- Issue date Jun 18, 2013
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system
- Patent number 8,319,960
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 8,289,507
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,274,651
- Issue date Sep 25, 2012
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,269,959
- Issue date Sep 18, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 8,254,662
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 8,233,145
- Issue date Jul 31, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 8,228,496
- Issue date Jul 24, 2012
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defects inspecting apparatus and defects inspecting method
- Patent number 8,228,495
- Issue date Jul 24, 2012
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and apparatus
- Patent number 8,134,701
- Issue date Mar 13, 2012
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,094,295
- Issue date Jan 10, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting particles or defects of a s...
- Patent number 8,072,597
- Issue date Dec 6, 2011
- Hitachi, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 8,045,148
- Issue date Oct 25, 2011
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,040,503
- Issue date Oct 18, 2011
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defects inspecting apparatus and defects inspecting method
- Patent number 8,013,989
- Issue date Sep 6, 2011
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,952,700
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,952,085
- Issue date May 31, 2011
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting defects on an object
- Patent number 7,940,383
- Issue date May 10, 2011
- Hitachi, Ltd.
- Minori Noguchi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
WALKING MODE DISPLAY METHOD, WALKING MODE DISPLAY SYSTEM AND WALKIN...
- Publication number 20210244317
- Publication date Aug 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Daisuke FUKUI
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...
- Publication number 20200278303
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi TADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20140218723
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Ichiro ISHIMARU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140002810
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE
- Publication number 20130269126
- Publication date Oct 17, 2013
- Sachio UTO
- B08 - CLEANING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION SYSTEM
- Publication number 20130250297
- Publication date Sep 26, 2013
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
Inspection Equipment and Inspection Method
- Publication number 20130187667
- Publication date Jul 25, 2013
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20130182100
- Publication date Jul 18, 2013
- Hitachi High-Technologies Corporation
- Kenji AIKO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130148113
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120312104
- Publication date Dec 13, 2012
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20120313650
- Publication date Dec 13, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DEFECT INSPECTION APPARATUS AND METHOD
- Publication number 20120268734
- Publication date Oct 25, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi NISHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
- Publication number 20120262709
- Publication date Oct 18, 2012
- Sachio Uto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20120133929
- Publication date May 31, 2012
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20120069329
- Publication date Mar 22, 2012
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Method and Its Apparatus for Inspecting Particles or Defects of a S...
- Publication number 20120062890
- Publication date Mar 15, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120006131
- Publication date Jan 12, 2012
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System For Monitoring Foreign Particles, Process Processing Apparat...
- Publication number 20120002196
- Publication date Jan 5, 2012
- Hidetoshi Nishiyama
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
- Publication number 20110310382
- Publication date Dec 22, 2011
- Sachio Uto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110228258
- Publication date Sep 22, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110032515
- Publication date Feb 10, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20100271473
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Kenji AIKO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect Inspection Method and Defect Inspection Apparatus
- Publication number 20100271627
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
- Publication number 20100259751
- Publication date Oct 14, 2010
- Sachio Uto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT INSPECTION APPARATUS AND METHOD
- Publication number 20100225903
- Publication date Sep 9, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi NISHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING APPARATUS
- Publication number 20100214561
- Publication date Aug 26, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20100140474
- Publication date Jun 10, 2010
- Akira HAMAMATSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20100106443
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20100103409
- Publication date Apr 29, 2010
- Yoshimasa Ohshima
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Testing Defects
- Publication number 20100088042
- Publication date Apr 8, 2010
- Minori NOGUCHI
- G01 - MEASURING TESTING

Minori Noguchi

Person

Patents Grantslast 30 patents

Support system for specified inspection, support method for specifi...

Surface inspection apparatus and method thereof

Inspection equipment and inspection method

Inspection apparatus

Defect inspection system

Apparatus and method for inspecting defect in object surface

Surface inspection apparatus and method thereof

Method of inspecting a semiconductor device and an apparatus thereof

Inspection apparatus

Defects inspecting apparatus and defects inspecting method

Apparatus and method for inspecting defect on object surface

Pattern defect inspection apparatus and method

Defect inspection system

Method of apparatus for detecting particles on a specimen

Method of inspecting a semiconductor device and an apparatus thereof

Inspection method and inspection apparatus

System for monitoring foreign particles, process processing apparat...

Pattern defect inspection apparatus and method

Defect inspection method and defect inspection apparatus

Defects inspecting apparatus and defects inspecting method

Defect inspecting method and apparatus

Inspection method and inspection apparatus

Method and its apparatus for inspecting particles or defects of a s...

System for monitoring foreign particles, process processing apparat...

Method of inspecting a semiconductor device and an apparatus thereof

Defects inspecting apparatus and defects inspecting method

Method of apparatus for detecting particles on a specimen

Surface inspection apparatus and method thereof

Defect inspection apparatus and defect inspection method

Method of detecting defects on an object

Patents Applicationslast 30 patents

WALKING MODE DISPLAY METHOD, WALKING MODE DISPLAY SYSTEM AND WALKIN...

SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...

SURFACE INSPECTION APPARATUS AND METHOD THEREOF

INSPECTION APPARATUS

APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE

INSPECTION APPARATUS AND INSPECTION SYSTEM

Inspection Equipment and Inspection Method

DEFECT INSPECTION SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

INSPECTION DEVICE AND INSPECTION METHOD

PATTERN DEFECT INSPECTION APPARATUS AND METHOD

DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD

INSPECTION METHOD AND INSPECTION APPARATUS

SURFACE INSPECTION APPARATUS AND METHOD THEREOF

Method and Its Apparatus for Inspecting Particles or Defects of a S...

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

System For Monitoring Foreign Particles, Process Processing Apparat...

DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

DEFECT INSPECTION SYSTEM

Defect Inspection Method and Defect Inspection Apparatus

DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD

PATTERN DEFECT INSPECTION APPARATUS AND METHOD

DEFECT INSPECTING APPARATUS

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Defect Inspection Apparatus and Defect Inspection Method

METHOD AND APPARATUS FOR DETECTING DEFECTS

Apparatus And Method For Testing Defects