Minoru Akiyama

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Fine-particle measuring apparatus
- Patent number 5,030,842
- Issue date Jul 9, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Masao Koshinaka
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting minute particles on or above a substrate
- Patent number 5,008,558
- Issue date Apr 16, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Masao Koshinaka
- G01 - MEASURING TESTING