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Minoru Ariyama

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Patents Grantslast 30 patents

  • Information Patent Grant

    Zero cross detection circuit and sensor device
    • Patent number 10,914,610
    • Issue date Feb 9, 2021
    • ABLIC INC.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Zero-crossing detection circuit and sensor device
    • Patent number 10,852,328
    • Issue date Dec 1, 2020
    • ABLIC INC.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fuse circuit and semiconductor integrated circuit device
    • Patent number 10,283,303
    • Issue date May 7, 2019
    • ABLIC INC.
    • Minoru Ariyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sensor circuit
    • Patent number 10,191,124
    • Issue date Jan 29, 2019
    • SII Semiconductor Corporation
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,110,213
    • Issue date Oct 23, 2018
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Temperature compensation circuit and sensor device
    • Patent number 10,088,532
    • Issue date Oct 2, 2018
    • ABLIC INC.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Detection device
    • Patent number 10,006,971
    • Issue date Jun 26, 2018
    • ABLIC INC.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Comparison circuit and sensor device
    • Patent number 9,837,997
    • Issue date Dec 5, 2017
    • SII Semiconductor Corporation
    • Minoru Ariyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Magnetic sensor
    • Patent number 9,810,746
    • Issue date Nov 7, 2017
    • SII Semiconductor Corporation
    • Kentaro Fukai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Comparison circuit
    • Patent number 9,768,758
    • Issue date Sep 19, 2017
    • SII SEMICONDUCTOR CORPORATION
    • Minoru Ariyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Magnetic sensor circuit with power supply fluctuation detection
    • Patent number 9,638,761
    • Issue date May 2, 2017
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor capable of identifying an individual having a high...
    • Patent number 9,523,743
    • Issue date Dec 20, 2016
    • SII Semiconductor Corporation
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,453,888
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,453,889
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Takemasa Miura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,322,672
    • Issue date Apr 26, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,267,818
    • Issue date Feb 23, 2016
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,261,569
    • Issue date Feb 16, 2016
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,128,127
    • Issue date Sep 8, 2015
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,866,474
    • Issue date Oct 21, 2014
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,502,529
    • Issue date Aug 6, 2013
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Constant current circuit start-up circuitry for preventing power in...
    • Patent number 8,476,891
    • Issue date Jul 2, 2013
    • Seiko Instruments Inc.
    • Tomoki Hikichi
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Magnetic sensor circuit
    • Patent number 8,305,075
    • Issue date Nov 6, 2012
    • Seiko Instruments Inc.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Physical quantity sensor
    • Patent number 8,207,778
    • Issue date Jun 26, 2012
    • Seiko Instruments Inc.
    • Manabu Fujimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,193,807
    • Issue date Jun 5, 2012
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor circuit
    • Patent number 8,106,646
    • Issue date Jan 31, 2012
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor circuit
    • Patent number 8,093,889
    • Issue date Jan 10, 2012
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Voltage dividing circuit and magnetic sensor circuit
    • Patent number 7,956,598
    • Issue date Jun 7, 2011
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Variable frequency oscillating circuit
    • Patent number 7,915,964
    • Issue date Mar 29, 2011
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Scan circuit and image sensor having scan circuit
    • Patent number 7,721,169
    • Issue date May 18, 2010
    • Seiko Instruments Inco.
    • Masahiro Yokomichi
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Amplifier circuit
    • Patent number 7,508,258
    • Issue date Mar 24, 2009
    • Seiko Instruments Inc.
    • Hirokazu Yoshizawa
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    ZERO-CROSSING DETECTION CIRCUIT AND SENSOR DEVICE
    • Publication number 20200124647
    • Publication date Apr 23, 2020
    • ABLIC Inc.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ZERO CROSS DETECTION CIRCUIT AND SENSOR DEVICE
    • Publication number 20190323859
    • Publication date Oct 24, 2019
    • ABLIC Inc.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR CIRCUIT
    • Publication number 20180059193
    • Publication date Mar 1, 2018
    • SII Semiconductor Corporation
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20180062631
    • Publication date Mar 1, 2018
    • SII Semiconductor Corporation
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ZERO-CROSSING DETECTION CIRCUIT AND SENSOR DEVICE
    • Publication number 20170336445
    • Publication date Nov 23, 2017
    • SII Semiconductor Corporation
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND MAGNETIC SENSOR DEVICE
    • Publication number 20170261566
    • Publication date Sep 14, 2017
    • SII Semiconductor Corporation
    • Kentaro FUKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEMPERATURE COMPENSATION CIRCUIT AND SENSOR DEVICE
    • Publication number 20160356862
    • Publication date Dec 8, 2016
    • SII Semiconductor Corporation
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPARISON CIRCUIT AND SENSOR DEVICE
    • Publication number 20160261253
    • Publication date Sep 8, 2016
    • SII Semiconductor Corporation
    • Minoru ARIYAMA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    COMPARISON CIRCUIT
    • Publication number 20160241222
    • Publication date Aug 18, 2016
    • SII Semiconductor Corporation
    • Minoru ARIYAMA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DETECTION DEVICE
    • Publication number 20160216339
    • Publication date Jul 28, 2016
    • SII Semiconductor Corporation
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20150377983
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Takemasa MIURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20150377647
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Kentaro FUKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150276891
    • Publication date Oct 1, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20150115942
    • Publication date Apr 30, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20150084620
    • Publication date Mar 26, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150040687
    • Publication date Feb 12, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OUTPUT DRIVER CIRCUIT
    • Publication number 20150035567
    • Publication date Feb 5, 2015
    • SEIKO INSTRUMENTS INC.
    • Masahiro MITANI
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150022241
    • Publication date Jan 22, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    FUSE CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • Publication number 20140240080
    • Publication date Aug 28, 2014
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20140232388
    • Publication date Aug 21, 2014
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20140232387
    • Publication date Aug 21, 2014
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20130076350
    • Publication date Mar 28, 2013
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20110241662
    • Publication date Oct 6, 2011
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHYSICAL QUANTITY SENSOR
    • Publication number 20110133812
    • Publication date Jun 9, 2011
    • Manabu Fujimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONSTANT CURRENT CIRCUIT
    • Publication number 20110127989
    • Publication date Jun 2, 2011
    • Tomoki Hikichi
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20110074404
    • Publication date Mar 31, 2011
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20100308815
    • Publication date Dec 9, 2010
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR CIRCUIT
    • Publication number 20100117715
    • Publication date May 13, 2010
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR CIRCUIT
    • Publication number 20100117637
    • Publication date May 13, 2010
    • Minoru Ariyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    VOLTAGE DIVIDING CIRCUIT AND MAGNETIC SENSOR CIRCUIT
    • Publication number 20090079411
    • Publication date Mar 26, 2009
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • H03 - BASIC ELECTRONIC CIRCUITRY