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Saitama, JP
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last 30 patents
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Patent Grant
Signal measurement device, signal measurement method, and recording...
Patent number
8,743,934
Issue date
Jun 3, 2014
Advantest Corporation
Minoru Iida
G01 - MEASURING TESTING
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Patent Grant
Multi-port analysis apparatus and method and calibration method the...
Patent number
7,359,814
Issue date
Apr 15, 2008
Advantest
Yoshikazu Nakayama
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SIGNAL MEASUREMENT DEVICE, SIGNAL MEASUREMENT METHOD, AND RECORDING...
Publication number
20120327990
Publication date
Dec 27, 2012
Advantest Corporation
Minoru IIDA
G01 - MEASURING TESTING