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Minoru Kobayashi
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical microscope and spectroscopic measurement method
Patent number
11,442,259
Issue date
Sep 13, 2022
Nanophoton Corporation
Minoru Kobayashi
G02 - OPTICS
Information
Patent Grant
Reflective objective lens and observation method
Patent number
11,016,278
Issue date
May 25, 2021
Nanophoton Corporation
Minoru Kobayashi
G02 - OPTICS
Information
Patent Grant
Optical microscope and spectrometry method
Patent number
9,927,297
Issue date
Mar 27, 2018
Nanophoton Corporation
Satoshi Kawata
G02 - OPTICS
Information
Patent Grant
Light blocking member applicable to microscope
Patent number
9,612,373
Issue date
Apr 4, 2017
Nanophoton Corporation
Satoshi Kawata
G02 - OPTICS
Information
Patent Grant
Microscope
Patent number
9,582,088
Issue date
Feb 28, 2017
Nanophoton Corporation
Satoshi Kawata
G02 - OPTICS
Information
Patent Grant
Spectrometry device and spectrometry method
Patent number
9,435,741
Issue date
Sep 6, 2016
Nanophoton Corporation
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Raman microscope and Raman spectrometric measuring method
Patent number
9,188,538
Issue date
Nov 17, 2015
Nanophoton Corporation
Shogo Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Optical recording material, optical recording method, photosensitiv...
Patent number
8,518,631
Issue date
Aug 27, 2013
Osaka University
Katsumasa Fujita
G11 - INFORMATION STORAGE
Information
Patent Grant
Optical microscope and spectrum measuring method
Patent number
8,081,309
Issue date
Dec 20, 2011
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Plasma display device
Patent number
7,965,039
Issue date
Jun 21, 2011
Panasonic Corporation
Hiroshi Watanabe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Fluorescence microscope for which a sample is observed based on the...
Patent number
7,781,711
Issue date
Aug 24, 2010
Osaka University
Katsumasa Fujita
G01 - MEASURING TESTING
Information
Patent Grant
Plasma display device including a chassis member having a plurality...
Patent number
7,768,202
Issue date
Aug 3, 2010
Panasonic Corporation
Keiji Uchida
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Optical microscope and spectrum measuring method
Patent number
7,561,265
Issue date
Jul 14, 2009
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL MICROSCOPE AND SPECTROSCOPIC MEASUREMENT METHOD
Publication number
20200249454
Publication date
Aug 6, 2020
NANOPHOTON CORPORATION
Minoru KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
REFLECTIVE OBJECTIVE LENS AND OBSERVATION METHOD
Publication number
20190219807
Publication date
Jul 18, 2019
Nanophoton Corporation
Minoru KOBAYASHI
G02 - OPTICS
Information
Patent Application
RAMAN MICROSCOPE AND RAMAN SPECTROMETRIC MEASURING METHOD
Publication number
20140132955
Publication date
May 15, 2014
Shogo Kawano
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE
Publication number
20140063226
Publication date
Mar 6, 2014
NANOPHOTON CORPORATION
Satoshi Kawata
G02 - OPTICS
Information
Patent Application
LIGHT BLOCKING MEMBER APPLICABLE TO MICROSCOPE
Publication number
20140002905
Publication date
Jan 2, 2014
NANOPHOTON CORPORATION
Satoshi Kawata
G02 - OPTICS
Information
Patent Application
OPTICAL MICROSCOPE AND SPECTROMETRY METHOD
Publication number
20140002819
Publication date
Jan 2, 2014
NANOPHOTON CORPORATION
Satoshi Kawata
G02 - OPTICS
Information
Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
Publication number
20130162990
Publication date
Jun 27, 2013
Nanophoton Corporation
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
Optical recording material, optical recording method, photosensitiv...
Publication number
20100323293
Publication date
Dec 23, 2010
Katsumasa Fujita
G02 - OPTICS
Information
Patent Application
Pulse Laser Light Timing Adjusting Device, Adjusting Method, and Op...
Publication number
20100232459
Publication date
Sep 16, 2010
Mamoru Hashimoto
G01 - MEASURING TESTING
Information
Patent Application
Optical microscope and spectrum measuring method
Publication number
20100128263
Publication date
May 27, 2010
NANOPHOTON CORP.
Minoru Kobayashi
G02 - OPTICS
Information
Patent Application
Fluorescence Microscope and Fluorescence Microscope Method
Publication number
20080215272
Publication date
Sep 4, 2008
Katsumasa Fujita
G02 - OPTICS
Information
Patent Application
Plasma Display Device
Publication number
20080211406
Publication date
Sep 4, 2008
Hiroshi Watanabe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Plasma Display Device
Publication number
20080150427
Publication date
Jun 26, 2008
Keiji Uchida
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Optical microscope and spectrum measuring method
Publication number
20070132994
Publication date
Jun 14, 2007
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING