Minoru Matsuura

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Minami-ashigara-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface defect inspector and method of inspecting surface defect
- Patent number 7,769,223
- Issue date Aug 3, 2010
- FUJIFILM Corporation
- Hiroaki Shinohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface defect inspector and method of inspecting surface defect
- Publication number 20070165941
- Publication date Jul 19, 2007
- FUJIFILM Corporation
- Hiroaki Shinohara
- G01 - MEASURING TESTING