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Minoru Sato
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Minamitsugaru-gun, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Connecting device for inspection
Patent number
11,899,054
Issue date
Feb 13, 2024
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING
Information
Patent Grant
Connecting device for inspection
Patent number
11,762,008
Issue date
Sep 19, 2023
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, optical probe array, test system and test method
Patent number
11,624,679
Issue date
Apr 11, 2023
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connecting device for inspection
Patent number
11,592,402
Issue date
Feb 28, 2023
Kabushiki Kaisha Nihon Micronics
Minoru Sato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe and probe card
Patent number
9,194,886
Issue date
Nov 24, 2015
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING
Information
Patent Grant
Electrical connecting apparatus
Patent number
7,119,561
Issue date
Oct 10, 2006
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONNECTING DEVICE FOR INSPECTION
Publication number
20220221502
Publication date
Jul 14, 2022
Kabushiki Kaisha Nihon Micronics
Minoru SATO
G01 - MEASURING TESTING
Information
Patent Application
CONNECTING DEVICE FOR INSPECTION
Publication number
20220214391
Publication date
Jul 7, 2022
Kabushiki Kaisha Nihon Micronics
Minoru SATO
G01 - MEASURING TESTING
Information
Patent Application
CONNECTING DEVICE FOR INSPECTION
Publication number
20220034821
Publication date
Feb 3, 2022
Kabushiki Kaisha Nihon Micronics
Minoru SATO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
Publication number
20210102864
Publication date
Apr 8, 2021
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrical connecting apparatus
Publication number
20050124144
Publication date
Jun 9, 2005
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING