Minoru YAMAZAKI

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam apparatus and method for controlling electron beam ap...
- Patent number 11,894,211
- Issue date Feb 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Erina Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,456,150
- Issue date Sep 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaori Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,257,658
- Issue date Feb 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,152,186
- Issue date Oct 19, 2021
- HITACHI HIGH-TECH CORPORATION
- Wataru Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,991,542
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryota Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,991,543
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and capturing condition adjusting meth...
- Patent number 10,770,266
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and inspection device
- Patent number 10,692,687
- Issue date Jun 23, 2020
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for adjusting imaging co...
- Patent number 10,566,172
- Issue date Feb 18, 2020
- Hitachi High-Technologies Corporation
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,546,715
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Shahedul Hoque
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam irradiation method and scanning electron microscope
- Patent number 9,640,366
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,627,171
- Issue date Apr 18, 2017
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,502,212
- Issue date Nov 22, 2016
- Hitachi High-Technologies Corporation
- Yuzuru Mizuhara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,159,529
- Issue date Oct 13, 2015
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting information of an electric potential on a samp...
- Patent number 8,766,182
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,648,300
- Issue date Feb 11, 2014
- Hitachi High-Technologies Corporation
- Miki Isawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,487,253
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting information of an electronic potential on a sa...
- Patent number 8,487,250
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,481,935
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting information of an electric potential on a samp...
- Patent number 8,263,934
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,080,790
- Issue date Dec 20, 2011
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,989,768
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230162943
- Publication date May 25, 2023
- Hitachi High-Tech Corporation
- U OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CALCULATING ROUGHNES...
- Publication number 20230095456
- Publication date Mar 30, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...
- Publication number 20220351934
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Erina KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20210313140
- Publication date Oct 7, 2021
- Kaori BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20200105501
- Publication date Apr 2, 2020
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Capturing Condition Adjusting Meth...
- Publication number 20200035449
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20200035450
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190362931
- Publication date Nov 28, 2019
- Hitachi High-Technologies Corporation
- Ryota WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND INSPECTION DEVICE
- Publication number 20190318906
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Wen LI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20190311875
- Publication date Oct 10, 2019
- Hitachi High-Technologies Corporation
- Wataru YAMANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Method for Adjusting Imaging Co...
- Publication number 20190172676
- Publication date Jun 6, 2019
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20180269026
- Publication date Sep 20, 2018
- Hitachi High-Technologies Corporation
- Shahedul HOQUE
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20150357153
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Hiroshi MAKINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150348748
- Publication date Dec 3, 2015
- Hitachi High-Technologies Corporation
- Yuzuru MIZUHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150014531
- Publication date Jan 15, 2015
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140014836
- Publication date Jan 16, 2014
- Hitachi High-Technologies Corporation
- Miki ISAWA
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting Information of an Electric Potential on a Samp...
- Publication number 20130284921
- Publication date Oct 31, 2013
- Minoru Yamazaki
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Irradiation Method and Scanning Electron Microscope
- Publication number 20130009057
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Detecting Information of an Electronic Potential on a Sa...
- Publication number 20120298863
- Publication date Nov 29, 2012
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120061566
- Publication date Mar 15, 2012
- Hitachi High-Technologies Corporation
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20110278454
- Publication date Nov 17, 2011
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Detecting Information of an Electric Potential on a Samp...
- Publication number 20090272899
- Publication date Nov 5, 2009
- Hitachi High-Technologies Corporation
- Minoru YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090224170
- Publication date Sep 10, 2009
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20090039264
- Publication date Feb 12, 2009
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS

Minoru YAMAZAKI

Person

Patents Grantslast 30 patents

Charged particle beam device

Electron beam apparatus and method for controlling electron beam ap...

Charged particle beam device

Charged particle beam apparatus

Charged particle beam device

Charged particle beam device

Charged particle beam device

Charged particle beam device and capturing condition adjusting meth...

Measurement and inspection device

Charged particle beam apparatus and method for adjusting imaging co...

Charged particle beam device

Electron beam irradiation method and scanning electron microscope

Charged particle beam device

Charged particle beam apparatus

Scanning electron microscope

Method for detecting information of an electric potential on a samp...

Charged particle beam apparatus

Scanning electron microscope

Method for detecting information of an electronic potential on a sa...

Scanning electron microscope

Method for detecting information of an electric potential on a samp...

Scanning electron microscope

Scanning electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CALCULATING ROUGHNES...

ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device and Capturing Condition Adjusting Meth...

Charged Particle Beam Device

Charged Particle Beam Device

MEASUREMENT AND INSPECTION DEVICE

Charged Particle Beam Device

Charged Particle Beam Apparatus and Method for Adjusting Imaging Co...

Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Apparatus

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM APPARATUS

Method for Detecting Information of an Electric Potential on a Samp...

Electron Beam Irradiation Method and Scanning Electron Microscope

Method for Detecting Information of an Electronic Potential on a Sa...

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE

Method for Detecting Information of an Electric Potential on a Samp...

SCANNING ELECTRON MICROSCOPE

ELECTRON MICROSCOPE