Minxuan Liu

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methodology to measure many more transistors on the same test area
- Patent number 7,190,185
- Issue date Mar 13, 2007
- LSI Logic Corporation
- Franklin Duan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
New methodology to measure many more transistors on the same test area
- Publication number 20050093560
- Publication date May 5, 2005
- Franklin Duan
- G01 - MEASURING TESTING